JIS Z 0602 PDF

JIS Z Test methods for flat pallets (FOREIGN STANDARD). Available for Subscriptions. Content Provider Japanese Industrial Standards [JIS]. Standard (JIS Z ) was performed. From the obtained results, the possibility of practical application was exam- ined. Moreover, the manufacturing process of. JIS Z – JIS Z Test methods for flat pallets. Publication date: ; Original language: English. Please select.

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Such a probability is a typical example of the binomial probability distribution. This is explained as follows.

Number of pieces rejected. The possible test results are limited to either 1 “failure or defect”or 2 “no failure or acceptance,” with no possibility of such results as “pending decision” or “exception acceptance” allowed.

This occurs in the case of a surge pulse withstand or mechanical impact test. Such a system is known as a series system of redundancy nis 0 figure B. Number of pieces accepted. Unless otherwise specified, use Inspection Standard II.

The reliability function R t for this system is given by the Poisson partial sum. Wear-outfailures which almost suddenly outbreak after a certain period approximate the normal distribution. This approximates AQL values.

A.1 AQL Sampling Table

If the sampled device is not returned non-replacementwe will have a hypergeometric distribution. This zz because the denominator of the defining expression equation IX component hours does not refer to any particular device. It is important to note that N no longer denotes the number of tests of Bernoulli trial due to the approximation of the binomial probability distribution to the Poisson distribution. For the system in figure B.


This is based on equation IX Introduction to Computing Systems 1 st Exam. A typical example of this is the movement of molecules of a classical, ideal gas. The Poisson distribution approximates the binomial probability distribution if the population is large and the phenomenon occurs with a low probability.

Jjis lot is acccepted when failures are grater than Ac but less then Re. This is known as the multinomial distribution.

That is, it is a non-maintainable component. As the device is subjected to more and more cycles of intermittent operation nas shown in figure B.

In general, once a semiconductor device has failed, it cannot be repaired and used again. To serve as an example, consider the life L in equation IX Use first sampling plan above arrow.

This probability is described by the binomial probability distribution fBin x, n, p. Therefore, the MTBF for a truncated portion of the life of the equipment up to the time T0 is estimated 0620 the following expression: Using a fixed value, in equation IX, for the number of damages k received before failure, consider the failure distribution function F t1, k as a function of time t1.


A.1 AQL Sampling Table

Each test result is independent from one another. Expected characteristics of the function fNorm x are these: This is referred to as upper 20 percent point.

The level of degradation of the device can be expressed as a function of the leakage current i. Chapter 5 – Basic Concepts of Probability.

JIS Z 0602:1988

Math Statistics And Probability A. These functions are shown in figure B.

We deal with this issue in B. As time t passes, the failure rate of these semiconductor devices changes. If the amount of change in the characteristic value is found to be accelerated by thermal stress, in many cases the Arrhenius chemical reaction kinetics model can be applied to this phenomenon.